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4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
Specifications
Brand Name :
CNOEC, OPTO-EDU
Model Number :
A63.7062
Certification :
CE,
Place of Origin :
China
MOQ :
1 pc
Price :
FOB $1~1000, Depend on Order Quantity
Payment Terms :
T/T, West Union, Paypal
Supply Ability :
5000 pcs/ Month
Delivery Time :
5~20 Days
Packaging Details :
Carton Packing, For Export Transportation
Resolution :
4.5nm@30KV(SE); 6nm@30KV(BSE)
Magnification :
Negative Magnification: 15x~250000x; Screen Magnification: 30x~500000x
Electron Gun :
Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge
Accelerating Voltage :
0~30KV
Lens System :
Three-level Electromagnetic Lens (Tapered Lens)
Objective Aperture :
Molybdenum Aperture Adjustable Outside Vacuum System
Specimen Stage :
Five Axes Stage
Max Specimen Diameter :
150mm
Description

4.5 - 6nm High Magnification Scanning Electron Microscope Surface Topography Eco SEM

Scanning electron microscopy (sem) is suitable for the observation of the surface topography of metals, ceramics, semiconductors, minerals, biology, polymers, composites and nano-scale one-dimensional, two-dimensional and three-dimensional materials (secondary electron image, backscattered electron image).It can be used to analyze the point, line and surface components of microregion.It is widely used in petroleum, geology, mineral field, electronics, semiconductor field, medicine, biology field, chemical industry, polymer material field, criminal investigation of public security, agriculture, forestry and other fields.

4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

Product Description

A63.7062 Eco Tungsten Filament SEM
Resolution 4.5nm@30KV(SE); 6nm@30KV(BSE)
Magnification Negative Magnification: 15x~250000x; Screen Magnification: 30x~500000x
Electron Gun Tungsten Heated Cathode-Pre Centered Tungsten Filament Carteidge
Accelerating Voltage 0~30KV
Lens System Three-level Electromagnetic Lens (Tapered Lens)
Objective Aperture Molybdenum Aperture Adjustable Outside Vacuum System
Specimen Stage Five Axes Stage
Travel Range X(Auto) 0~50mm
Y(Auto) 0~50mm
Z(Manual) 0~25mm
R(Manual) 360º
T(Manual) -5º~90º
Max Specimen Diameter 150mm
Detector High Vacuum Secondary Electron Detector (With Detector Protection)
Modification Stage Upgrade;EBL;STM;AFM;Heating Stage;Cryo Stage;Tensile Stage;Micro-nano Manipulator;SEM+Coating Machine;SEM+Laser
Accessories CCD,LaB6,X-Ray Detector(EDS),EBSD,CL,WDS,Coating Machine
Vacuum System Turbo Molecular Pumps;Rotation Pump
Electron Beam Current 10pAt~0.1μA
PC Customized Dell Work Station

Product Display

4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

Optional Accessories

4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem 4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

Company Information

OPTO-EDU is one of the top professional supplier for microscope from China, we focus in microscope & educational field for more than 20 years. As the top recommended seller for microsocpe on alibaba, we have full types microscopes, including biological microscope, stereo microscope, metallurgical microscope, inverted microscope, fluorescent microscope, polarizing microscope, phase contrast microscope, dark field microscope, multi-viewing microscope, DIC microscope, AFM/STM/SPM microscope, zoom microscope, gem microscope, digital micoscope, LCD microscope, comparison microscope, forensic microscope, and all kinds of microscope accessories. Our customer comes from more than 104 countries, such as United States, Britain, Russia, Canada, Germany, Denmark, Poland, Sweden, U.A.E., Qatar, Saudi Arabia, Egypt, Mexico, Argentina, Chile, Brazil, Korea, Thailand, India, Indonsia, Philliphine and so on. We have been working tirelessly to supply China's nice quality production to the world market!

Product tags

sem scanning electron microscope

,

scanning electron microscope

,

electron scanning microscope
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4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

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Product Detail
Brand Name :
CNOEC, OPTO-EDU
Model Number :
A63.7062
Certification :
CE,
Place of Origin :
China
MOQ :
1 pc
Price :
FOB $1~1000, Depend on Order Quantity
Contact Supplier
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem
4.5 - 6nm High Magnification Scanning Microscope Electron Surface Topography Eco Sem

Opto-Edu (Beijing) Co., Ltd.

Verified Supplier
12 Years
beijing, beijing
Since 1995
Business Type :
Manufacturer, Distributor/Wholesaler, Exporter, Trading Company, Seller
Main Products :
Compound Optical Microscope, Stereo Optical Microscope, Digital Optical Microscope
Total Annual :
6000000-8000000
Employee Number :
10~20
Certification Level :
Verified Supplier
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