10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation Video from China

Test Finger Probe

Apr 20, 2025

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Product Description: IEC61032 Test Finger Probe Test Probe B Jointed Test Finger 10N Force 1. Introduction of Test Probe B: The test probe is is design according to IEC61032 figure 2, meet the requirements of UL507, ...learn more

10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

15 working days

USD450-600/set

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Pego Electronics (Yi Chun) Company Limited

Verified Supplier

7 Years

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Test Probe 11 Unjointed Test Finer Probe with 50N Thruster Conforms to IEC61032

Test Probe 11 Unjointed Test Finer Probe with 50N Thruster Conforms to IEC61032

Similar Test Finger Probe B With 50mm Circular Stop Face IEC 60335-1 Clause 20.2

Similar Test Finger Probe B With 50mm Circular Stop Face IEC 60335-1 Clause 20.2

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High Precision Rod Test Finger Probe C with 3 Newton Thruster Apply To IP3X Testing

High Precision Rod Test Finger Probe C with 3 Newton Thruster Apply To IP3X Testing

High Precision Rod Test Finger Probe C with 3 Newton Thruster Apply To IP3X Testing

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