IEC61032 IP Testing Equipment Jointed Test Finger for Safety Test IP2 Test Probe B
Product information for IP Testing Equipment:
Jointed Test FingerJointed test finger is used to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.
In the test requirements of preventing from approaching to the hazardous parts, the probe B test probe needs to with a 30N thrust. The product without force should be used with push-pull dynamometers.
In the test of against electric shock, wiring ,configuration and power and indicating device are needed. Turn on the power of the tested sample, and exert the corresponding force to determine whether the grounding line are connected
Standard for IP Testing Equipment:
IEC 60529: 2013 Degrees of protection provided by enclosures (IP Code), IEC61032 figure 2
Application for IP Testing Equipment: It is applied to verification of basic protection against human access to hazardous parts, and it is also for protection against fingers.
Feature for Jointed Test Finger:
Name: Jointed Test Finger
Norme: IEC 61032 fig. 2 Probe B
Finger Probe – Stainless Steel Alloy
Hand, top face & handle – nylon with excellent dielectric resistance
Parameters(mm):
Model | HT-I02 |
Name | Standard Test Finger |
Joint 1 | 30±0.2 |
Joint 2 | 60±0.2 |
Finger length | 80±0.2 |
Fingertip to baffle | 180±0.2 |
Cylindrical | R2±0.05 |
Spherical | R4±0.05 |
Fingertip cutting bevel angle | 37° |
Fingertip taper | 14° |
Test finger diameter | Ф12 |
A-A Section diameter | Ф50 |
A-A Section width | 20±0.2 |
Baffle diameter | Ф75±0.2 |
Baffle thickness | 5±0.5 |
Force | ---- |
Applied standard | IEC61032-1 |
Product detail picture: