Changeable Ferrous Probe Automotive Paint Thickness Gauge For Magnetoresistance
High Accuracy Changeable Ferrous Probe & Metal Shell Coating Thickness Gauge For Magneto-Resistance
Functions & Features
1) Software for PC connection and data analysis
2) High quality metal sheel
3) With back-light
4) Easy operation: Switch off automatically or manually.
5) With five calibration specimens: 1024μm,513μm,249μm 99.8μm,48.5μm)
Technical Parameters
Technical Parameters |
Model No. | Leeb230 |
Measuring principle | Fe |
Measuring range (µm) | 0~1250μm |
Probe | Changeable |
Shell | Metal |
Accuracy | ±(1~3%H+1) μm; H refers to the thickness of testing piece |
Minimum resolution (µm) | 0.1μm |
Min curvature of the min area (mm) | Convex1.5 Concave9 |
Diameter of the min area (mm) | Φ7 |
Critical thickness of substrate (mm) | 0.5 |
Memory | 300 groups measured data |
Dimensions | 115*70*30mm |
Power supply | AAA Alkaline battery |
Standard Configuration | Main Machine, 1 probe & substrate*1, 5 calibration specimens (48.5μm,99.8μm,249μm,513μm,1024μm) |
Optional Accessories | Probes,Specimens |
Measuring Principle
Magnetic measurement method (With Fe Probe)
Measuring Non-magnetic coatings on magnetic substrates (such as aluminum, chromium, copper, rubber coatings on steel, iron, alloy and hard magnetic steel substrates).
When the probe contact with cover, measuring probe and magnetic metal matrix form a closed magnetic circuit, as a result of the existence of a non-magnetic layer, make the magnetic circuit magnetic resistance change, can be derived by measuring the change the thickness of coating.
Substrate
a) Standard methods for magnetic substrate metal magnetic properties and surface roughness, tested should stay with the substrate metal magnetic and surface roughness is similar.For eddy current method, standard pieces of the electrical properties of the metal matrix, and the tested should stay with the substrate similar to the electrical properties of the metal.To confirm the applicability of the standard piece, available
standard piece of base metal and under test on a substrate metal comparing measured by the readings.
b) If under test pieces of metal substrate thickness is no more than the critical thickness stipulated in the table 1, the following two methods can be used for calibration:
1) Stay with the same test pieces of metal substrate thickness metal on-chip calibration standard;
2) With a sufficient thickness, electrical properties of similar metal liner metal standard or specimen, but it must be made between base metal and liner metal without clearance. On the two sides have cladding specimens, cannot use liner method.
c) If the curvature of the coating under test has reached the calibration can't on the plane, have the covering layer of the curvature of the standard piece or of the curvature of the substrate metal under calibration foils, shall be the same with the curvature of the specimen.
5 calibration specimens (48.5μm,99.8μm,249μm,513μm,1024μm)
