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Environmental Test Machine Customized High And Low Temperature Accelerated Aging Chamber
Environmental Test Machine Customized High And Low Temperature Accelerated Aging Chamber
Specifications
Brand Name :
Haida
Model Number :
HD-64-NVME
Certification :
ISO,CE
Place of Origin :
China
MOQ :
1set
Price :
5000-12000 USD
Payment Terms :
L/C, D/A, D/P, T/T, Western Union, MoneyGram
Supply Ability :
150 Sets/Months
Delivery Time :
15 Days After Order
Packaging Details :
Strong Wooden Case
cooling method :
air-cooled
weight :
about 900KG
Inner box size :
W620*D450*H1100mm
temperature resolution :
0.01℃
Description

Environmental Test Machine Customized High And Low Temperature Accelerated Aging Chamber

Feature

  • Support customization of the number of PCIE test chips, such as 32 chips, 36 chips, 64 chips, 96 chips, 156 chips, 216 chips, etc.;
  • Support research and development of micro-miniature customization, such as 4 pieces, 8 pieces, etc.
  • Support (-70°~+ 180°) test
  • Support abnormal power failure test and aging test
  • Support automated temperature control testing;
  • Support all intelligent control tests with software;
  • Support customization of test software;
  • Support the balance of wind speed and temperature in the box;
  • Support rapid heating and cooling control;
  • Support customized research and development of PCIE aging;
  • Support network control, you can control the test in different places and see the test results;
  • Support APP remote control test;

The whole machine test system mainly includes high and low temperature box, PC main board, PM board, chip board, FPGA board, product tooling, rear warehouse TEST PC and test software, etc. The hardware part.

SSD Intelligent Test System Overview

The intelligent test system of SSD adopts the Win10 operating system platform, through the open script mode, the temperature of the high and low temperature box and the test items of PCIE products can be modified arbitrarily, and the data transmission is carried out through the LINUX system and the network switch to realize one-button operation, networked control, saving labor, realizing intelligent data management, and permanently retaining test results.

Information

product model HD-64-PCIE
Inner box size W620×D450×H1100mm
Outer box size 约 W1640×D1465×H1875mm(integrated machine))
Inner box volume 460L
Opening method Single door (right open)
cooling method air-cooled
weight about 900KG
power supply AC 220V about 6.5 KW

Temperature Parameter

temperature range -5℃~100℃
Temperature fluctuation

≤±0.5℃

≤±1℃
temperature offset ≤±2℃
temperature resolution 0.01℃
Heating rate 5℃/min (mechanical cooling, under standard load)
temperature change rate

High temperature can meet 5℃~8℃/min nonlinear adjustable (measured at the air outlet, mechanical refrigeration, under standard load), low temperature can meet 0℃~2℃/min nonlinear

Adjustable (measured at the air outlet, mechanical cooling, under normal load)
temperature uniformity ≤±2℃
standard load 10KG aluminum block, 500W load;

Test Standard

GB/T5170.2-2008 Temperature test equipment

GB/2423.1-2008 (IEC60068-2-1:2007) low temperature test method AB.

GB/2423.2-2008 (IEC60068-2-2:2007) high temperature test method BA.

GJBl50.3 (MIL-STD-810D) high temperature test method.

GJBl50.4 (MIL-STD-810D) low temperature test method.

Control System

Display Color LCD display
Operation mode Program mode, fixed value mode
Setting Chinese and English menu (optional), touch screen input
Setting range Temperature: Adjust according to the temperature working range of the equipment (upper limit +5°C, lower limit -5°C)

display resolution

Temperature: 0.01°C

Time: 0.01min

control method

BTC balanced temperature control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature test equipment)

BTHC balanced temperature and humidity control method + DCC (intelligent cooling control) + DEC (intelligent electrical control) (temperature and humidity test equipment)

Curve record function

 It has RAM with battery protection, which can save the set value, sampling value and sampling time of the device; the maximum recording time is 350 days (when the sampling period is 1.5min)

Accessory function

Fault alarm and cause, processing prompt function

Power-off protection function

Upper and lower limit temperature protection function

Calendar timing function (automatic start and automatic stop operation)

self-diagnosis function

Our Company Introduction:
HAIDA INTERNATIONAL is a professional manufacturer of various kinds of testing equipments over 24 years. HAIDA products are widely used in paper products, packaging, ink printing, adhesive tapes, bags, footwear, leather products, environment, toys, baby products, hardware, electronic products, plastic products, rubber products and other industries, and applicable to all scientific research units, quality inspection institutions and academic fields.

Environmental Test Machine Customized High And Low Temperature Accelerated Aging Chamber

Product tags

thermal cycle test chamber

,

high and low temperature test chamber

,

temperature cycle test chamber
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Environmental Test Machine Customized High And Low Temperature Accelerated Aging Chamber

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Product Detail
Brand Name :
Haida
Model Number :
HD-64-NVME
Certification :
ISO,CE
Place of Origin :
China
MOQ :
1set
Price :
5000-12000 USD
Contact Supplier
Environmental Test Machine Customized High And Low Temperature Accelerated Aging Chamber

Dongguan Haida Equipment Co.,LTD

Verified Supplier
12 Years
guangdong, dongguan
Since 2003
Business Type :
Manufacturer
Main Products :
Tensile Testing Machines, Environmental Test Chambers, Temperature Humidity Chambers
Total Annual :
5000000-7000000
Employee Number :
80~100
Certification Level :
Verified Supplier
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