Rohde and Schwarz FSWP50 Phase Noise Analyser 1 MHz to 50 GHz Tested in working conditions

Description of FSWP50 Phase noise analyzer

The R&S®FSWP phase noise analyzer and VCO tester is very sensitive thanks to extremely low-noise internal sources and cross-correlation. It can measure phase noise and amplitude noise in mere seconds on highly stable sources such as those in radar applications. Additional options such as pulsed signal measurements, residual phase noise (including pulsed) characterization and integrated high‑end signal and spectrum analysis make the R&S®FSWP a unique test instrument.

Thanks to its fully digital signal processing, the R&S FSWP performs complex measurements at the push of a button and features intuitive touchscreen operation. It can quickly and easily measure the phase noise of pulsed sources as well as residual phase noise under pulsed conditions. The R&S FSWP is therefore ideal for both aerospace and defense and automotive applications, e.g. for manufacturers of radar components and synthesizers. Thanks to its additional voltage sources, the R&S FSWP is also ideal for measuring VCOs, in research and development and, thanks to its high measurement speed, also in production.

Available models:

R&S FSWP8

R&S FSWP26

R&S FSWP50

Key facts
■ High end signal and spectrum analyzer and phase noise tester in one box
■ Cross correlation for very sensitivity of high amplitude and phase noise measurement in parallel, even on pulsed signals
■ Frequency range from 1 MHz up to 50 GHz, 325 GHz with external mixers
■ Internal source for measuring residual phase noise on pulsed signals
■ SCPI recorder to simplify code generation

Key features

■ Wide dynamic range thanks to a low noise level of –156 dBm (1 Hz) (without noise cancellation and preamplifier) and high TOI of typ. 25 dBm ❙ Total measurement uncertainty of < 0.2 dB up to 3.6 GHz, < 0.3 dB up to 8 GHz ❙ Phase noise of –140 dBc (1 Hz) at 1 GHz (100 kHz offset) ❙ 320 MHz signal analysis bandwidth ❙ Optional internal measurement applications for

■ Pulse measurements (R&S®FSWP-K6)

■ Vector signal analysis, for analyzing digitally modulated single carriers (R&S®FSWP-K70)

■ Modulation analysis of analog-modulated (AM, FM, φM) single carriers (R&S®FSWP-K7)

■ Noise figure measurements (R&S®FSWP-K30)

Specifications for internal DC source Supply voltage 0 V to 16 V Max. current load 2000 mA Tuning voltage –10 V to +28 V Max. current load 20 mA Complete VCO characterization At the press of a button, the R&S®FSWP measures all the parameters needed to characterize a VCO:

■ Frequency versus voltage

■ Tuning slope versus voltage

■ Output power versus voltage

■ Current drain versus voltage

The R&S®FSWP phase noise analyzer and VCO tester is the optimal test solution for radar applications and when de‑ veloping and manufacturing synthesizers, OCXOs, DROs and VCOs. It can be easily configured to meet the required application. The instrument's low‑noise internal local os‑ cillator makes it possible to measure most commercially available synthesizers and oscillators without any addition‑ al options. For high‑end applications, the R&S®FSWP can be equipped with a second receive path, which enables cross‑correlation and, depending on the number of cor‑ relations used, increases sensitivity – by up to 25 dB. The analyzer's excellent internal sources and largely digital ar‑ chitecture make it faster than test systems that digitize the signal after the phase detector. In addition, the R&S®FSWP measures the phase noise of pulsed sources and the residual phase noise of individual (also pulsed) components at the push of a button. It can use the internal source as well as an external source if users possess e.g. a very well suited oscillator. This was previously only possible with costly and complex systems using external sources, splitters and phase shifters. The R&S®FSWP not only measures phase noise, it is also a full-featured signal and spectrum analyzer. A spectrum analyzer helps users determine, for example, if the desired signal is available. The R&S®FSWP is an all-in-one solution, so users can eas‑ ily switch between various measurement channels. One glance at the spectrum and then on with the phase noise measurements – no problem.

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