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2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
Specifications
Brand Name :
ZMKJ
Model Number :
2inch*0.625mmt
Place of Origin :
CHINA
MOQ :
10pcs
Price :
by case
Payment Terms :
T/T, Western Union, MoneyGram
Supply Ability :
1-50pcs/month
Delivery Time :
2-4weeks
Packaging Details :
single wafer package in 100-grade cleaning room
Material :
SiC single crystal 4H-N type
Grade :
Dummy / research/ Production grade
Thicnkss :
0.625MM
Suraface :
as-cut
Application :
polish device test
Diameter :
50.8mm
Description


Customzied size/10x10x0.5mmt/2inch/3inch/4inch/6inch 6H-N/4H-SEMI/ 4H-N SIC ingots/High purity 4H-N 4inch 6inch dia 150mm silicon carbide single crystal (sic) substrates wafersS/ Customzied as-cut sic wafers

About Silicon Carbide (SiC)Crystal

Silicon carbide (SiC), also known as carborundum, is a semiconductor containing silicon and carbon with chemical formula SiC. SiC is used in semiconductor electronics devices that operate at high temperatures or high voltages, or both.SiC is also one of the important LED components, it is a popular substrate for growing GaN devices, and it also serves as a heat spreader in high-power LEDs.

1. Description

SILICON CARBIDE MATERIAL PROPERTIES

Property

4H-SiC, Single Crystal

6H-SiC, Single Crystal

Lattice Parameters

a=3.076 Å c=10.053 Å

a=3.073 Å c=15.117 Å

Stacking Sequence

ABCB

ABCACB

Mohs Hardness

≈9.2

≈9.2

Density

3.21 g/cm3

3.21 g/cm3

Therm. Expansion Coefficient

4-5×10-6/K

4-5×10-6/K

Refraction Index @750nm

no = 2.61 ne = 2.66

no = 2.60 ne = 2.65

Dielectric Constant

c~9.66

c~9.66

Thermal Conductivity (N-type, 0.02 ohm.cm)

a~4.2 W/cm·K@298K c~3.7 W/cm·K@298K

Thermal Conductivity (Semi-insulating)

a~4.9 W/cm·K@298K c~3.9 W/cm·K@298K

a~4.6 W/cm·K@298K c~3.2 W/cm·K@298K

Band-gap

3.23 eV

3.02 eV

Break-Down Electrical Field

3-5×106V/cm

3-5×106V/cm

Saturation Drift Velocity

2.0×105m/s

2.0×105m/s

2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test

2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test

2 inch diameter Silicon Carbide (SiC) Substrate Specification

Grade

Production Grade

Research Grade

Dummy Grade

Diameter

50.8 mm±0.38 mm

Thickness

330 μm±25μm or customzied

Wafer Orientation

On axis : <0001>±0.5° for 6H-N/4H-N/4H-SI/6H-SI Off axis : 4.0° toward  1120  ±0.5° for 4H-N/4H-SI

Micropipe Density

≤5 cm-2

≤15 cm-2

≤50 cm-2

Resistivity

4H-N

0.015~0.028 Ω·cm

6H-N

0.02~0.1 Ω·cm

4/6H-SI

>1E5 Ω·cm

(90%) >1E5 Ω·cm

Primary Flat

{10-10}±5.0°

Primary Flat Length

15.9 mm±1.7 mm

Secondary Flat Length

8.0 mm±1.7 mm

Secondary Flat Orientation

Silicon face up: 90° CW. from Prime flat ±5.0°

Edge exclusion

1 mm

TTV/Bow /Warp

≤15μm /≤25μm /≤25μm

Roughness

Polish Ra≤1 nm

CMP Ra≤0.5 nm


Cracks by high intensity light

None

None

1 allowed, ≤1 mm

Hex Plates by high intensity light

Cumulative area≤1 %

Cumulative area≤1 %

Cumulative area≤3 %


Polytype Areas by high intensity light

None

Cumulative area≤2 %

Cumulative area≤5%


Scratches by high intensity light

3 scratches to 1×wafer diameter cumulative length

5 scratches to 1×wafer diameter cumulative length

8 scratches to 1×wafer diameter cumulative length

Edge chip

None

3 allowed, ≤0.5 mm each

5 allowed, ≤1 mm each
CATALOGUE COMMON SIZE

4H-N Type / High Purity SiC wafer/ingots
2 inch 4H N-Type SiC wafer/ingots
3 inch 4H N-Type SiC wafer
4 inch 4H N-Type SiC wafer/ingots
6 inch 4H N-Type SiC wafer/ingots


4H Semi-insulating / High Purity SiC wafer

2 inch 4H Semi-insulating SiC wafer
3 inch 4H Semi-insulating SiC wafer
4 inch 4H Semi-insulating SiC wafer
6 inch 4H Semi-insulating SiC wafer
6H N-Type SiC wafer
2 inch 6H N-Type SiC wafer/ingot
Customzied size for 2-6inch

About ZMKJ Company

ZMKJ can provides high quality single crystal SiC wafer ( Silicon Carbide ) to electronic and optoelectronic industry . SiC wafer is a next generation semiconductor material , with unique electrical properties and excellent thermal properties , compared to silicon wafer and GaAs wafer , SiC wafer is more suitable for high temperature and high power device application . SiC wafer can be supplied in diameter 2-6 inch , both 4H and 6H SiC , N-type , Nitrogen doped , and semi-insulating type available . Please contact us for more product information .


Our Relation Products
Sapphire wafer＆ lens/ LiTaO3 Crystal/ SiC wafers/ LaAlO3 / SrTiO3/wafers/ Ruby Ball/ Gap wafers

2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test

FAQ:

Q: What's the way of shipping and cost and pay term ?

A:(1) We accept 100％ T/T In advance by DHL, Fedex, EMS etc.

(2) If you have your own express account, it's great.If not,we could help you ship them.

Freight is in accordance with the actual settlement.

Q: What's your MOQ?

A: (1) For inventory, the MOQ is 2pcs.

(2) For customized products, the MOQ is 10pcs up.

Q: Can I customize the products based on my need?

A: Yes, we can customize the material, specifications and shape, size based on your needs.

Q: What's the delivery time?

A: (1) For the standard products

For inventory: the delivery is 5 workdays after you place the order.

For customized products: the delivery is 2 or 3 weeks after you place the order.

(2) For the special-shaped products, the delivery is 4 workweeks after you place the order.

Product tags

silicon carbide wafer

,

silicon carbide crucible sizes

,

sic wafer
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2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test

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Product Detail
Brand Name :
ZMKJ
Model Number :
2inch*0.625mmt
Place of Origin :
CHINA
MOQ :
10pcs
Price :
by case
Payment Terms :
T/T, Western Union, MoneyGram
Contact Supplier
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test
2Inch 4inch Silicon Carbide Wafer 6H-N/ 4H-N Dummy SiC Crystal Wafers For Device Test

SHANGHAI FAMOUS TRADE CO.,LTD

Verified Supplier
7 Years
shanghai, shanghai
Since 2013
Business Type :
Manufacturer, Agent, Importer, Exporter, Trading Company
Main Products :
Sapphire Substrate, Doped Sapphire Crystal, Sapphire Optical Windows
Total Annual :
1000000-1500000
Certification Level :
Verified Supplier
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