SHEN ZHEN XIN MING HONG ELECTRONIC CO.,LIMITED professional manufacture SMD LED for 10 years with good quality and best performance. Our products include 0603 0805 1206 3528 5050 etc.
3MM TOWER TYPE LED LAMPS
Features:
Applications:
Package Dimensions:
Electrical and optical characteristics(Ta=25Electrical and optical characteristics(Ta=25C)Electrical and optical characteristics(Ta=25C)Electrical and optical characteristics(Ta=25C)C)
Parameter | Symbol | Min. | Typ. | Max. | Unit | Test Condition |
Luminous Intensity | Iv | 50 | --- | 80 | mcd | If=20mA (Note 1) |
Viewing Angle | 2θ1/2 | --- | 120 | --- | Deg | (Note 2) |
Dominant Wave Length | p | 560 | 565 | 570 | nm | IF=20mA (Note 3) |
Forward Voltage | VF | 1.9 | 2.0 | 2.4 | V | IF=20mA |
Reverse Current | IR | --- | --- | 100 | µA | VR=5V |
Soldering
Preheating:140°C-160°C±5°C,within 2 minutes.
Operation heating:235°C(MAX.) within 10 seconds.
Gradual Cooling(Avoid quenching)
Preheating:140°C-160°C±5°C,within 2 minutes.
Operation heating:235°C(MAX.) within 10 seconds.
Gradual Cooling(Avoid quenching)
Dip soldering(wave soldering)
Preheating:120°C-150°C, within 120-180 sec
Operation heating:245°C±5°C within 5 sec.260°C(MAX)
Gradual cooling(Avoid quenching)
Reliablity test items and conditions:
The reliablity of products shall be satisfied with items listed below.
Confidence level:97%
LTPD:3%
NO | Item | Test Conditions | Test Hours/Cycle | Sample Size | Failure Judgment Criteria | AC/RE |
1 | Solder Heat | TEMP:260°C±5ºC | 10 SEC | 76pcs | IV≦Ivt*0.5 or VF≧U or VF≦L | 0/1 |
2 | Temperature Cycle | H:+100ºC 15min L:-40ºC 15min | 300 CYCLES | 76pcs | 0/1 | |
3 | Thermal Shock | H:+100ºC 5min~10sec L:-10ºC 5min | 300 CYCLES | 76pcs | 0/1 | |
4 | High Temperature Storage | TEMP:100°C | 1000HRS | 76pcs | 0/1 | |
5 | Low Temperature Storage | TEMP:-40°C | 1000HRS | 76pcs | 0/1 | |
6 | DC Operating Life | TEMP:25°C If=20MA | 1000HRS | 76pcs | 0/1 | |
7 | High Temperature/High Humidity | 85ºC /85℅RH | 1000HRS | 76pcs | 0/1 |
Note:Ivt:To test Iv value of the chip before the reliablility test
Iv:The test value of the chip that has completed the reliablility test
U: Upper specifications Limit
L: Lower specifications Limit